Dektak 150
The Dektak 150 is a high-precision surface profilometer used to measure the thickness, roughness, and step height of thin films and coatings. It employs a stylus that scans across the surface of a sample to provide accurate topographical data at the micron and nanometer scales. With its user-friendly interface and versatile measurement capabilities, the Dektak 150 is ideal for applications in research, semiconductor fabrication, and material science. It allows for precise characterization of surface features, ensuring quality control and consistency in manufacturing processes.
Edmond J. Safra (Givat-Ram)
Nano Center
Contacts
- Golan Tanami
- golant@savion.huji.ac.il